Mid-century edit · Free shipping over $85 · Shop teak & mustard
Login Register
EUR193.00 EUR231.00

Pay in 4 interest-free payments of $48.25 Learn more

MF172400 - SEMI MF1724 - Test Method for Measuring Surface Metal Contamination of Polycrystalline Silicon by Acid Extraction-Atomic Absorption Spectroscopy StdPbc-0707 SEMI MS2-1109 (complete rewrite)

SKU: 65937727132
4.8

Shipping Estimate
USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Aug 12 - Aug 17

Description

SEMI MS2-1109 (complete rewrite)

SEMI F63-0521 (technical revision)

SEMI E78-0998 (first published)

Therefore methods are required that allow a fast in-line characterization and sorting of wafers

MF172400 - SEMI MF1724 - Test Method for Measuring Surface Metal Contamination of Polycrystalline Silicon by Acid Extraction-Atomic Absorption Spectroscopy StdPbc-0707 SEMI MS2-1109 (complete rewrite)#VALUE!

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

You may also like

recommand products